High-speed photo relays optimised for semiconductor test technology

Rutronik now offers Toshiba's TLP3414S and TLP3431S, new high-speed photo relays for semiconductor testing. Improved infrared LEDs and optimised photodiode arrays in these models facilitate a reduction in switch-on times of up to 62% to 150µs while maintaining signal quality. This greatly increases efficiency in test systems. Additionally, the 20% smaller S-VSON4T package saves valuable space on the circuit board. These performance features make the relays an excellent choice for pin electronics applications in semiconductor testers that demand high switching speeds and precise signal control.

The TLP3414S has a maximum switch-on resistance of 3Ω, and the TLP3431S is just 1.2Ω. The typical output capacitance of these variants is 6.5pF – a decisive factor in lessening high-frequency signal losses when switched off. The voltage and current values in the ON and OFF phases are 40V/250mA for the TLP3414S and 20V/450mA for the TLP3431S.

Both photo relays are encased in the space-saving S-VSON4T housing with dimensions of only 1.4mm × 2mm × 1.3mm. This not only supports the miniaturisation of modern test systems but also enhances thermal and electrical performance thanks to shorter signal paths. Optimised optical coupling provides improved infrared LEDs and photodiode arrays for high-efficiency.

Application examples include pin electronics of automatic test equipment (ATE).