Dedicated phase noise analysis and VCO testing excellence

12-10-2021 | Rohde & Schwarz | Test & Measurement

Rohde & Schwarz created the new R&S FSPN phase noise analyser and VCO tester for design and production engineers who characterise sources such as synthesisers, VCOs, OCXOs, and DROs. Offering very high sensitivity and measurement speed, the device is excellent for demanding phase noise and VCO analysis in development and production.

The device is supplied in two models: one covers the frequency range from 1MHz to 8GHz and the other from 1MHz to 26.5GHz, addressing radar and satellite applications in the C band, X band, Ku band, and the complete K band. Catering to the individual measurement challenges in these fields, it expands the company phase noise product portfolio. The device shares tried-and-tested R&S FSWP features, including low noise internal local oscillators together with real-time cross-correlation engines for increased measurement sensitivity.

The device is also equipped with three ultra-low-noise DC sources to supply and sweep VCOs. The built-in VCO characterisation measurement mode analyses VCO characteristics such as sensitivity, frequency, RF power or current draw versus tuning voltage. For a more in-depth view of the device under test, the spot-noise versus tune measurement mode combines a sweep with ultra-low-noise DC sources plus fast and accurate phase noise measurements. VCO harmonics can also be measured versus tuning voltage with no extra spectrum analyser.

Since the company designed the device as a pure phase noise analyser, all relevant measurement modes and enhancements come standard. Users just need to select the frequency range to order.

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