These strengthened functions upgrade the high-quality waveform performance of the PAM4*2 PPG MU196020A to the most recent high-speed, large-capacity PCI Express standards for PCIe receiver tests. Subsequently, customers planning and developing PCIe Gen 6 (PAM4 32 Gbaud) products for data centres and other applications now hold an all-in-one measuring instrument for future PCIe Gen 6 upgrades as well as current PCIe 3.0/4.0/5.0 receiver tests.
The company is providing this all-in-one test solution covering both future PCIe 6.0 evaluations and current PCIe 5.0 compliance tests to assist customers in reducing product times to market.
The series are multichannel BER measuring instruments needed for designing and inspecting next-generation network interfaces, such as 400 and 800GbE*5, including high-speed bus interfaces, such as PCI Express 4.0/5.0, USB3.2/4, Thunderbolt, etc.
These extra functions support early-stage development of PAM4 PCIe 6.0 devices employing the PAM4 PPG MU196020A with high-quality data output performance. Furthermore, utilising these functions with the current SI ED MU195040A PCI solution supports PCIe 3.0/4.0/5.0 compliance tests as an all-in-one solution for PAM4 performance evaluations and compliance tests.