Test fixture allows HF impedance measurement of irregular shape components

04-08-2020 | MDL | Subs & Systems

Electronic components in an extensive variety of shapes and sizes can be tested employing a new test fixture from Hioki. Available now from MDL Technologies, the IM9202 makes it easy to get reliable high-frequency measurements of surface mount and leaded components when using Hioki's IM7580 series of high-performance impedance analysers.


Use of the versatile fixture makes testing simpler, and allows more reliable and repeatable measurements, fewer handling errors, higher throughput and greater measurement accuracy. The device flexibility in use makes it easy to test complex components, with resulting savings in time and costs.


The IM9202 can handle SMDs of irregular shape including axial and radial leaded components, as well as film capacitors and RFID and NFC tags. SMDs from 1.6mm to 23mm long can be tested as well as radial components with lead spacings of up to 26mm.


"The Hioki IM9202 lets component manufacturers measure devices that are larger than with other test fixtures, while also being more affordable," said MDL managing director Mark Lucock.


The Hioki IM7580 series impedance analysers for which the fixture is intended are offered in five models, giving measurement frequency bands up to 3GHz. With a half-rack footprint and a palm-sized test head, they provide test speeds as fast as 0.5ms with a repeatability of 0.07%.






Applications for the new test fixture incorporate the research and development of large or irregular shape components for employment in high power, high-frequency circuits, as well as components and antennas for RFID and NFC circuits.

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