New MEMS accelerometers enable early defect detection
Test & Measurement
Analog Devices has introduced three-axis, MEMS accelerometers that perform high-resolution vibration measurement with very low noise to enable the early detection of structural defects via wireless sensor networks.
The low power consumption of the new ADXL354 and ADXL355 accelerometers extends battery life and allows extended product usage by reducing the time between battery changes. The low noise performance of the ADXL354 and ADXL355 with low power consumption makes it now possible to cost-effectively enable low-level vibration measurement applications such as structural health monitoring (SHM).
Additionally, the tilt stability of ADXL354 and ADXL355 accelerometers delivers exceptional repeatability over temperature and time, which is ideal for orientation and navigation systems in unmanned aerial vehicles using inertial measurement units (IMUs) and inclinometers. By providing repeatable tilt measurement under all conditions, the new accelerometers enable minimal tilt error without extensive calibration in harsh environments.
The ADXL354 and ADXL355 accelerometers offer 'guaranteed' temperature stability with null offset coefficients of 0.15mg/C (max). The stability minimizes resource and expense associated with calibration and testing effort, helping to achieve higher throughput for device OEMs. In addition, the hermetic package helps ensure that the end product conforms to its repeatability and stability specifications long after they leave the factory.
With output of ±2g to ±8g full scale range (FSR), selectable digital filtering from 1Hz to 1kHz, and low noise density of 25µ/Hz at less than 200µA current consumption, the ADXL354 and ADXL355 accelerometers offer performance level comparable to much more expensive devices with less power consumption and BOM cost, says the company.