Microscope software easily captures precise, repetitive 2D Images and measurements

27-01-2022 | Olympus | Test & Measurement

The Olympus PRECiV software allows production, quality control, and inspection users to make precise, repetitive 2D measurements and get results that comply with the latest industrial standards. The software makes microscopy workflows faster and more efficient with robust data sharing and security features.


The software turns any manual microscope into a comprehensive imaging and measurement platform. The software controls all Olympus conventional industrial microscopes, their coded functions, its motorised nosepieces, and digital microscope cameras. It supports brightfield, darkfield, MIX (directional darkfield), polarisation and DIC imaging for flexibility and provides robust colour rendering and high resolution to deliver high-clarity images.


The software’s intuitive interface is easy to use with a navigation tab that groups the software’s functions, such as observation, acquisition and measurement, utilising large, clearly labelled buttons. For newer users, advanced settings stay hidden while experienced users can readily access all the available features and functions. The home screen can be customised so that the features and functions utilised most often can be easily accessed.


The software facilitates precise, repetitive two-dimensional measurements on a live or recorded image. Powerful functions such as auto edge detection to reliably measure the distance between two points, auxiliary lines to create complex geometric measurements, and a magic wand for automatic area detection allow inspectors to be confident in their data.


Acquiring all-in-focus images that extend beyond the microscope’s field of view is also easy. The EFI function serially receives multiple images in different focal planes, while the panorama function allows users to move the stage over the sample and then stitch those images together into one large image. Using the software, you can now combine instant EFI and panorama images while keeping users’ hands on the microscope.


For advanced applications like grain sizing or non-metallic inclusions, optional Materials Solutions guide users through the steps needed to obtain measurements that comply with the latest standards, including ISO, ASTM and JIS.

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