Cleanliness inspection system can now be used as a digital microscope

21-07-2021 | Olympus | Test & Measurement

The OLYMPUS CIX100 cleanliness inspection system’s latest software update incorporates a new microscope mode, giving component manufacturers an all-in-one imaging solution for particle analysis and microscope inspections.


The system is a turnkey solution applied to technical cleanliness inspection with a guided workflow, analysis tools and integrated industry standards. An optimised autofocus routine and optional overview scan in CIX software version 1.5 speed up the automated analysis, making it even simpler to deliver repeatable results quickly. The new microscopy mode allows users to leave the dedicated cleanliness inspection workflow to perform microscopic imaging for other applications.


Microscope mode capabilities can be extended with a suite of optional material analysis solutions enabling users to customise the system for their requirements.


The update incorporates a streamlined workflow for routine cleanliness applications where the overview scan is not necessary. Users can profit from faster scanning with a deactivation option, as well as enhanced autofocus and fibre classification.


Now the system supports the ASTM E1216-11 standard, including the calculation of the SCI.


New systems are supplied with CIX software version 1.5 and Microsoft SQL Server 2017.

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