Flaw detector redefines the standard for phased array

04-11-2019 | Olympus | Test & Measurement

The Olympus OmniScan X3 flaw detector joins the essential tools required for PAUT inspections, such as TOFD, two UT channels, eight groups and 16:64PR, 16:128PR and 32:128PR configurations. Wireless connectivity to the Olympus Scientific Cloud keeps the instrument’s software up to date.


The comprehensive onboard scan plan tool facilitates users to visualise the inspection, assisting to lessen the risk of errors. The entire scan plan, comprising the TFM zone, can be performed in one simple workflow. Creating a setup is also quicker with improved calibration tools and support for simultaneous probe and beam set configuration, onboard dual linear, matrix and dual matrix array creation and automatic wedge verification.






Certified IP65 dustproof and water-resistant, the instrument has the dependability and ease of use that the company's flaw detectors are known for together with high-quality images that assist in interpreting flaws more apparent. With the total focusing method, users can create geometrically correct images to confirm the characterisation of flaws identified through conventional phased array techniques and get better images throughout the volume of a part. Further features that allow excellent images include a 16-bit A-scan, interpolation and smoothing and a vivid 10.6" WXGA display that offers clarity and visibility in any light.


The flaw detector makes analysis and reporting quicker, both onboard the instrument and on a PC. The instrument also includes a variety of helpful data interpretation tools.

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