RF-sampling ADC directly samples input frequencies from DC to over 10GHz

The ADC12DL3200, from Texas Instruments, is an RF-sampling, giga-sample, ADC that will directly sample input frequencies from DC to over 10GHz. In the dual-channel mode, the device can sample up to 3200MSPS and in single-channel mode up to 6400MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) enable development of flexible hardware that satisfies the requirements of both high-channel count or broad instantaneous signal bandwidth applications. Full-power input bandwidth (–3dB) of 8GHz and a useable frequency range enables direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The device uses a low-latency, LVDS interface for latency-sensitive applications or when the simplicity of LVDS is favoured. The interface uses up to 48 data pairs, four DDR clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signalling rates of up to 1.6Gbps. Strobe signals simplify synchronisation across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronisation is further eased by innovative synchronisation features such as noiseless aperture delay (T_AD) adjustment and SYSREF windowing.