New dual-channel ADCs designed for high SNR

Texas Instruments ADC32RF44 Dual-Channel, 14-Bit, 2.6GSPS RF-Sampling ADC, available now from Mouser, offers input frequencies up to 4GHz and is designed for high SNR. The device produces a noise spectral density of –154.2dBFS/Hz and a dynamic range including channel isolation over a broad input frequency range. The buffered analog input with on-chip termination minimises sample-and-hold glitch energy, resulting in uniform input impedance across a broad frequency range. Phase-coherent frequency hopping occurs as each ADC channel is connected to a dual-band, DDC with up to three independent, 16-bit NCOs per DDC. The device features front-end peak and RMS power detectors, as well as alarm functions to support external AGC algorithms. Additionally, the JESD204B serial interface with subclass 1-based deterministic latency is supported by using data rates up to 12.5Gbps with up to four lanes per ADC. An industrial temperature range of –40C to +85C is supported by these analog-to-digital converters.