ADC can directly sample input frequencies from DC to above 10GHz

Texas Instruments ADC12DJ2700 device is an RF-sampling, giga-sample, ADC that can directly sample input frequencies from DC to above 10GHz. In dual-channel mode, the device can sample up to 2700MSPS and up to 5400MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) enable development of flexible hardware that satisfies the needs of both high channel count or broad instantaneous signal bandwidth applications. Full-power input bandwidth (–3dB) of 8GHz, with usable frequencies exceeding the –3dB point in both dual and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The device uses a high-speed JESD204B output interface with up to 16 serialised lanes and subclass-1 compliance for deterministic latency and multi-device synchronisation. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and the number of lanes. Innovative synchronisation features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional DDCs in dual-channel mode allow for a reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).