Reliable data quickly achieved with new confocal microscope

18-12-2017 | Olympus | Test & Measurement

Olympus’ new confocal microscope saves time with four times higher scan speed and improves efficiency in industrial inspection. The LEXT OLS5000 combines 4K scanning and a large working distance with easy-to-use software to capture the shape of any sample under any angle. Acquiring highly accurate data in less time, the microscope incorporates a PEAK algorithm for 3D data construction. This algorithm, combined with the intelligent Skip Scan function, has decreased data acquisition times by 75%. These time savings make the new device ideal for high throughput applications, such as quality control in the electronic component, semiconductor and automotive industries. With the new extension frame of the microscope, samples of up to 210mm can be analysed. Moreover, with an ultra-long working distance objective, it is possible to measure dents of up to 25mm and carry out thorough inspection of even the most challenging samples. The device comes with intuitive software with the capability to automate settings that beforehand had to be specified by the operator. The Smart Scan function and analysis templates automate the workflow from data acquisition to reporting, making it easy for anyone to operate the microscope by pushing the start button. These features make the microscope simple to handle, even for novice operators.

By Electropages Admin