This Month's Top 5 T&M Product Launches

06-10-2015 |   |  By Paul Whytock

Tester for tomorrow's V2X applications

Future intelligent transport systems will be implemented using standards such as IEEE 802.11p WLAN. This standard enables vehicles and infrastructures to share information in order to warn drivers of hazards such as accidents, road construction sites and slippery roads.


The V2X end-to-end tester for vehicle-to-vehicle and vehicle-to-infrastructure applications from Rohde & Schwarz is based on the fully automated R&S TS-ITS100 RF conformance test system. The RF conformance test system is augmented by the Vector CANoe application and communications test system, which monitors radio communications and internal vehicle buses and even simulates some of them.

New LTE-Advanced software

Anritsu has released its new LTE-Advanced Carrier Aggregation (CA) 4CC measurement software for the MT8821C Radio Communication Analyser, together with multiple new LTE-Advanced capabilities.


The company says the availability of the (MX882112C-041) software upgrade now makes the MT8821C the world’s first one box measurement solution for LTE-Advanced CA 4CC tests.

The rise in demand for services such as mobile video streaming and social networking applications is driving the need for carriers to adopt new LTE-Advanced standards with faster throughput and richer functions. As a result, the R&D divisions of mobile device and chipset manufacturers increasingly need test and measurement solutions that support higher data rates using LTE-Advanced CA 4CC and LTE TDD-FDD joint CA technologies, as well as higher-order modulations such as LTE DL 256QAM.

Light wave measurement system expanded

Keysight Technologies has introduced the 81607A, 81608A and 81609A tunable laser sources, a range of modules for the Keysight 8164B light wave measurement system.


The new modules extend the product family that the company launched earlier this year with the Keysight 81606A tunable laser source, an instrument with good sub-picometer tuning repeatability and wavelength accuracy that is maintained in full-speed, two-way sweeps.

The new value and basic line models share the 81606A’s new design with low spontaneous emission and narrow line width, good power repeatability and long-term stability. The new modules offer engineers additional price-performance options based on output power, tuning speed, wavelength accuracy and repeatability.

In conjunction with new high-speed circuitry and noise reduction techniques, the monochromator also enables the AQ6375B to achieve a high measurement speed: up to 0.5sec/100 nm.

Spectrum analyser operates in SWIR region

The new Yokogawa AQ6375B is an optical spectrum analyser operating in the short-wavelength infrared (SWIR) region covering wavelengths from 1200 to 2400 nm.

With a design based on the company's AQ6375 instrument, the new analyser combines high measurement performance with ease of operation and incorporates a number of new features including a gas purging feature, a built-in cut-off filter, data-logging capabilities, a double-speed mode and support for Windows file sharing.

The AQ6375B offers high wavelength accuracy of ±0.05 nm (1520 to 1580 nm) ±0.50 nm (full range) and high wavelength resolution of 0.05 nm, a wide close-in dynamic range of 55 dB, and a wide measurement level range from +20 dBm to -70 dBm.

World’s only 64Gbps signal quality analyser

Anritsu has released the 64Gbps test platform for engineers investigating the latest signal Integrity, modulations, high speed PAM4 (pulse amplitude modulation) transmission techniques intended for use in 200Gbps and 400Gbps communications links.


The platform, which provides high-quality signal generation up to 64.2Gbps, consists of the Anritsu MP1800A Signal Quality Analyzer (Bit Error Rate Tester, BERT), combined with the new MP1861A 64G Mux, MP1862A 64G Demux, MZ1854A PAM4 converter. This platform provides integrated capability to add multiple jitter stresses at any generated signal bit rate, for complete jitter tolerance and signal integrity simultaneous analysis.


By Paul Whytock

Paul Whytock is European Editor for Electropages. He has reported extensively on the electronics industry in Europe, the United States and the Far East for over twenty years. Prior to entering journalism he worked as a design engineer with Ford Motor Company at locations in England, Germany, Holland and Belgium.

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