New photorelays for semiconductor test applications released

Toshiba Electronics Europe GmbH has released a new photorelay capable of operating with a low-voltage drive. This and the extended operating temperature range make it excellent for demanding semiconductor test applications.

Semiconductor testers verify that the DUT meets specifications by applying a voltage/current to the relevant pins. Traditional relays are not suitable, so photorelays are common due to their solid-state operation and compact size. Typically, an FPGA is employed for control, but compatibility can be an issue as these increasingly operate at 1.8V.

The new TLP3412SRLA offers the company's lowest-ever photorelay operating voltage (VFON) of just 1.6V, making it appropriate for use with low-voltage 1.8V FPGAs. A resistor is built in on the primary (LED) side, allowing voltage-controlled operation without requiring external resistors.

The new device has a maximum operating temperature rating of 125C, thereby ensuring adequate temperature margin within the equipment.

With the demand for high levels of throughput in semiconductor testing, multiple DUTs are often tested in parallel, needing very dense probe card designs. The device is housed in the company's original S-VSON4T small package measuring just 1.45mm × 2mm × 1.4mm.

The new photorelay is configured for a 1-Form-A (NO) contact type and has an on-state current (ION) of 400mA continuously or 1200mA when pulsed (IONP). The on-state resistance is typically 1-Ohm and switching times (tON/tOFF) are less than 350μs/150μs respectively. Isolation voltage (BVs) is at least 500Vrms.

The device is ideal for semiconductor testing and is also suited to many challenging industrial applications, including PLCs.