To speed up real-world testing of mobile handsets for LTE networks ahead of
network deployment, Aeroflex is introducing the first one-box test system
for cell phone signal fading simulation.
Integrated within the 7100 Series digital radio test set, the new fading
simulator option offers RF engineers an inexpensive and reliable baseband
tool for signal fading profiling, a requirement for LTE (Long Term
Evolution) certification, says the company.
"Until now, testing and simulating LTE fading profiles meant buying and
cabling together two separate test instruments," said Phil Medd, product
manager, Aeroflex Test Solutions. "By integrating the LTE fading simulator
into the 7100 Series, Aeroflex will save customers tens of thousands of
dollars in purchasing additional test equipment and circumvent potential
calibration errors that cause faulty test results. In addition, confidence
is boosted by the repeatability of the fading profiles."
Fading simulators, combined with noise generators, modify RF signals
transmitted by the LTE system simulator (in this case the 7100 Series) and
emulate degradations introduced into the radio channel by real-life
obstacles such as buildings and foliage. For LTE developers who must profile
signal fading on mobile handsets to meet 3GPP requirements before a network
is available, the 7100 Series fading simulator allows engineers to perform
realistic signal fading simulations in a reliable and repeatable lab
environment.
As the world's cellular network operators work towards adopting LTE, the
demand is growing to meet all of the LTE requirements, including fading
profiles specified by 3GPP in 36-521-1. The Aeroflex 7100 Series test
platform provides fading simulation that meets or exceeds all 3GPP
requirements, as well as an unprecedented degree of flexibility in
allocating cells and fading taps for LTE user equipment (UE) without the
need for manual reconfiguration. The fully repeatable test scenarios
presented by the 7100 Series with the fading simulator include the emulation
of dynamic environments and realistic and accurate testing of MIMO
(multiple-input/multiple output) scenarios.
RF engineers, system integrators, and regression test engineers need to be
ready to test new frequency allocations for LTE features at any time. With
the LTE future in mind, the 7100 Series fading simulator supports all LTE
bandwidths to 20 MHz with a frequency range up to 6 GHz. The Aeroflex fading
simulator supports all 3GPP fading profiles, allowing users to determine if
their device conforms to 3GPP test specifications.
Based on Aeroflex's tried and tested RF and baseband technology, the 7100
Series digital radio test set is 'unique' in its support of both RF
parametric and protocol testing for LTE terminal devices. The 7100 Series
simulates a network from the physical layer to the core network IP
infrastructure. Focused on the R&D market, from components to handsets, the
Aeroflex 7100 Series is a comprehensive test system for LTE mobile devices
incorporated into a small footprint, single bench-top instrument, says the
company.
