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Thermo Electron - Measurement and metrology for semiconductor and related Industries
Published Mar 1 2006 

Thermo Electron - Measurement and metrology for semiconductor and related Industries The publication of a new brochure demonstrating its complete range of high-performance solutions for the semiconductor, microelectronics and disk storage industry, has been announced by Thermo Electron.

The 8-page brochure provides process and defect engineers, as well as production managers, with a quick reference to the company's offerings in the fields of plasma mass spectroscopy, FT-IR metrology, Raman microspectroscopy and numerous X-ray spectroscopies including angle-resolved XPS, microbeam XRF and EDS for electron microscopy and defect review.

The brochure demonstrates the company's expertise in these manufacturing environments with specifically engineered instrumentation in both the support lab, and on the fab floor with near-line and at-line measurement and metrology tools that meet the rigorous demands of production monitoring. The brochure provides a review of the capabilities, characteristics, benefits and applications of this instrument family, and provides background regarding each instrument's underlying technique.

As yield management tools to monitor production parameters and locate defects become even more critical to the financial success of the fabrication units, and as wafer sizes grow to 300mm and feature sizes shrink to 45 nanometers, fast and reliable methods that accurately measure the chemistry and physical dimensions of silicon wafers and packaging are imperative. Thermo offers several proven techniques for the production of semiconductor wafers, microchips, solid state circuitry and microelectronics.

Many of the semiconductor production monitoring tools include wafer handling automation built to industry-standard guidelines and feature built-in automated analytical methods tied to production control and an information system, says the company.


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